Current Help System: PC-DMIS CMM (View Core Help)

## Introduction to Performing Advanced Scans

Advanced scans are DCC stitch-type scans done by a Touch Trigger Probe (TTP ) and in some scans an analog probe. These scans are driven by PC-DMIS and the CMM controller. The DCC scanning procedure uses an intelligent, self-adapting algorithm that can calculate surface normal vectors for accurate probe compensation.

These advanced scans utilize a TTP which allows for automatic point-to-point digitizing of profiles on surfaces. Simply specify the necessary parameters for the DCC scan, select the Measure button and the scanning algorithm in PC-DMIS will take control of the measurement process.

The types of advanced scans supported by PC-DMIS include:

- Linear Open

- Linear Close

- Patch

- Section

- Perimeter

- Rotary

- Freeform

- UV

- Grid

For information on the options available in the Scan dialog box, the dialog box used to perform these scans, see the "Common Functions of the Scan Dialog Box" in the PC-DMIS Core documentation.