Current Help System: PC-DMIS CMM (View Core Help)

### About Adaptive Scanning

Not every user with access to scanning hardware is an expert and understands how to configure various controlling parameters that affect accuracy and throughput, such as scan speed, point density, offset force, and so on. With Adaptive Scanning, you don't need to be an expert, since it removes the guesswork out of configuring such scanning parameters. Adaptive Scanning uses a system comprised of expert knowledge to calculate those parameters based on known inputs, such as tolerance, feature type and size, stylus length, and surface finish. You only need to supply the information known to you, and the Adaptive Scanning algorithms perform the work of choosing the other settings.

Adaptive Scanning is "Controller Aware". This means that if a certain capability exists on a controller that will improve the scanning accuracy and throughput, the software will automatically make use of these capabilities as needed.

The measurement strategies for the Adaptive Scanning feature are available through the Measurement Strategies tab in the Probe Toolbox for these Auto Features: Circle, Cone, Cylinder, Line, and Plane. For complete information about measurement strategies, see Working with Measurement Strategies.